VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

Name: VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
Price: 123007.00 XOF
Availability: OutOfStock

Product ID: 298894284

Secure Transaction

Frequently Bought Together

Description

VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

Common Questions

Trustpilot

TrustScore 4.5 | 7,300+ reviews

Meera L.

Smooth transaction and product arrived in perfect condition.

3 weeks ago

Anjali K.

The product quality is outstanding. Exactly what I needed for my work.

1 month ago

View all Trustpilot reviews

Shop Global, Save with Desertcart

Value for Money

Competitive prices on a vast range of products

Shop Globally

Serving over 300 million shoppers across more than 200 countries

Enhanced Protection

Trusted payment options loved by worldwide shoppers

Customer Assurance

Trusted payment options loved by worldwide shoppers.

Desertcart App

Shop on the go, anytime, anywhere.

Trustpilot

TrustScore 4.5 | 7,300+ reviews

Ayesha M.

The product exactly matches the description. Very satisfied with my purchase.

5 days ago

Yusuf A.

Fantastic experience overall. Will recommend to friends and family.

1 month ago

View all Trustpilot reviews