Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

Name: Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry
Price: 16561.00 XOF
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Product ID: 287271514

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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

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